coherent refractive microlens arrays Search Results


90
Photonics Inc refractive microlens arrays
Refractive Microlens Arrays, supplied by Photonics Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/coherent+refractive+microlens+arrays/microlens+array/10__1364_slash_oe__23__024525-59-16-20
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94
Coherent Corp coherent refractive microlens arrays
Fig. 2. Scanning electron microscopy (SEM) images of a) overview of different microlenses milled into the glass substrate using P-FIB at 60 and 200 nA of Xe beam current and b) cross- section view revealing the profile of a 55-µm <t>microlens.</t> SEM stage tilt is 52°. c) Parabolic fit to the measured profile of the lens from (b).
Coherent Refractive Microlens Arrays, supplied by Coherent Corp, used in various techniques. Bioz Stars score: 94/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/coherent+refractive+microlens+arrays/MICRO+LENS+ARRAYS/10__1364_slash_oe__26__013647-19-9-9
Average 94 stars, based on 1 article reviews
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90
Physik Instrumente collimator and microlens unit
Fig. 2. Scanning electron microscopy (SEM) images of a) overview of different microlenses milled into the glass substrate using P-FIB at 60 and 200 nA of Xe beam current and b) cross- section view revealing the profile of a 55-µm <t>microlens.</t> SEM stage tilt is 52°. c) Parabolic fit to the measured profile of the lens from (b).
Collimator And Microlens Unit, supplied by Physik Instrumente, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/coherent+refractive+microlens+arrays/collimator+and+microlens+unit/pm17614716-39-3-14
Average 90 stars, based on 1 article reviews
collimator and microlens unit - by Bioz Stars, 2026-11
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90
Lumitex Inc microlens
Fig. 2. Scanning electron microscopy (SEM) images of a) overview of different microlenses milled into the glass substrate using P-FIB at 60 and 200 nA of Xe beam current and b) cross- section view revealing the profile of a 55-µm <t>microlens.</t> SEM stage tilt is 52°. c) Parabolic fit to the measured profile of the lens from (b).
Microlens, supplied by Lumitex Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/coherent+refractive+microlens+arrays/microlens/us06893394-146-6-9
Average 90 stars, based on 1 article reviews
microlens - by Bioz Stars, 2026-11
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90
Lytro Inc microlens
Fig. 2. Scanning electron microscopy (SEM) images of a) overview of different microlenses milled into the glass substrate using P-FIB at 60 and 200 nA of Xe beam current and b) cross- section view revealing the profile of a 55-µm <t>microlens.</t> SEM stage tilt is 52°. c) Parabolic fit to the measured profile of the lens from (b).
Microlens, supplied by Lytro Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/coherent+refractive+microlens+arrays/microlens/pmc04065604-35-5-2
Average 90 stars, based on 1 article reviews
microlens - by Bioz Stars, 2026-11
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90
Hamamatsu er-150 ccd progressive scan interline chip with microlens
Fig. 2. Scanning electron microscopy (SEM) images of a) overview of different microlenses milled into the glass substrate using P-FIB at 60 and 200 nA of Xe beam current and b) cross- section view revealing the profile of a 55-µm <t>microlens.</t> SEM stage tilt is 52°. c) Parabolic fit to the measured profile of the lens from (b).
Er 150 Ccd Progressive Scan Interline Chip With Microlens, supplied by Hamamatsu, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/coherent+refractive+microlens+arrays/charge+coupled+device+ccd+camera/pm14628676-68-14-5
Average 90 stars, based on 1 article reviews
er-150 ccd progressive scan interline chip with microlens - by Bioz Stars, 2026-11
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90
Zibra Corporation microlens
Fig. 2. Scanning electron microscopy (SEM) images of a) overview of different microlenses milled into the glass substrate using P-FIB at 60 and 200 nA of Xe beam current and b) cross- section view revealing the profile of a 55-µm <t>microlens.</t> SEM stage tilt is 52°. c) Parabolic fit to the measured profile of the lens from (b).
Microlens, supplied by Zibra Corporation, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/coherent+refractive+microlens+arrays/microlens/10__1109_slash_jmems__2011__2127456-171-4-22
Average 90 stars, based on 1 article reviews
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Canon inc oral jaw bones photographed (canon eos 77d, microlens)
Fig. 2. Scanning electron microscopy (SEM) images of a) overview of different microlenses milled into the glass substrate using P-FIB at 60 and 200 nA of Xe beam current and b) cross- section view revealing the profile of a 55-µm <t>microlens.</t> SEM stage tilt is 52°. c) Parabolic fit to the measured profile of the lens from (b).
Oral Jaw Bones Photographed (Canon Eos 77d, Microlens), supplied by Canon inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/coherent+refractive+microlens+arrays/digital+camera+canon+eos+77d/bio_rxiv__2024__12__18__629189-65-21-16
Average 90 stars, based on 1 article reviews
oral jaw bones photographed (canon eos 77d, microlens) - by Bioz Stars, 2026-11
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90
Konica Minolta cs-1000 with a microlens
Fig. 2. Scanning electron microscopy (SEM) images of a) overview of different microlenses milled into the glass substrate using P-FIB at 60 and 200 nA of Xe beam current and b) cross- section view revealing the profile of a 55-µm <t>microlens.</t> SEM stage tilt is 52°. c) Parabolic fit to the measured profile of the lens from (b).
Cs 1000 With A Microlens, supplied by Konica Minolta, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/coherent+refractive+microlens+arrays/spectral+radiance+meter/us08223178-142-24-26
Average 90 stars, based on 1 article reviews
cs-1000 with a microlens - by Bioz Stars, 2026-11
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CardioFocus Inc microlens-tipped fibers
Fig. 2. Scanning electron microscopy (SEM) images of a) overview of different microlenses milled into the glass substrate using P-FIB at 60 and 200 nA of Xe beam current and b) cross- section view revealing the profile of a 55-µm <t>microlens.</t> SEM stage tilt is 52°. c) Parabolic fit to the measured profile of the lens from (b).
Microlens Tipped Fibers, supplied by CardioFocus Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/coherent+refractive+microlens+arrays/microlens+tipped+fibers/10__1158_slash_1078___0432__ccr___04___2582-53-9-11
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CeramOptec gmbh optical fibre with a microlens
Fig. 2. Scanning electron microscopy (SEM) images of a) overview of different microlenses milled into the glass substrate using P-FIB at 60 and 200 nA of Xe beam current and b) cross- section view revealing the profile of a 55-µm <t>microlens.</t> SEM stage tilt is 52°. c) Parabolic fit to the measured profile of the lens from (b).
Optical Fibre With A Microlens, supplied by CeramOptec gmbh, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/coherent+refractive+microlens+arrays/optical+fibre+with+a+microlens/pm36108391-164-17-25
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Optofluidics Inc microlens
Fig. 2. Scanning electron microscopy (SEM) images of a) overview of different microlenses milled into the glass substrate using P-FIB at 60 and 200 nA of Xe beam current and b) cross- section view revealing the profile of a 55-µm <t>microlens.</t> SEM stage tilt is 52°. c) Parabolic fit to the measured profile of the lens from (b).
Microlens, supplied by Optofluidics Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/coherent+refractive+microlens+arrays/microlens/10__1016_slash_j__proeng__2010__09__141-17-7-8
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Image Search Results


Fig. 2. Scanning electron microscopy (SEM) images of a) overview of different microlenses milled into the glass substrate using P-FIB at 60 and 200 nA of Xe beam current and b) cross- section view revealing the profile of a 55-µm microlens. SEM stage tilt is 52°. c) Parabolic fit to the measured profile of the lens from (b).

Journal: Optics Express

Article Title: Fabrication of glass microlenses using focused Xe beam

doi: 10.1364/oe.26.013647

Figure Lengend Snippet: Fig. 2. Scanning electron microscopy (SEM) images of a) overview of different microlenses milled into the glass substrate using P-FIB at 60 and 200 nA of Xe beam current and b) cross- section view revealing the profile of a 55-µm microlens. SEM stage tilt is 52°. c) Parabolic fit to the measured profile of the lens from (b).

Article Snippet: M. B. Stern and T. R. Jay, “Dry-Etching for Coherent Refractive Microlens Arrays,” J Opt a-Pure Appl Op 8, S407– S429 (1994).

Techniques: Electron Microscopy

Fig. 1. Pattern for milling microlens in glass with P-FIB is a) a parabolic profile where lateral pixels represent the position of the beam and the value of the pixels is proportional to the amount of material to be milled away. b) The patterns are 8-bit bitmap images. To reduce digitalization errors, the pattern is raster-scanned in three steps with each step the pattern rotated by 120°. The procedure is repeated until the desired mill depth is achieved.

Journal: Optics Express

Article Title: Fabrication of glass microlenses using focused Xe beam

doi: 10.1364/oe.26.013647

Figure Lengend Snippet: Fig. 1. Pattern for milling microlens in glass with P-FIB is a) a parabolic profile where lateral pixels represent the position of the beam and the value of the pixels is proportional to the amount of material to be milled away. b) The patterns are 8-bit bitmap images. To reduce digitalization errors, the pattern is raster-scanned in three steps with each step the pattern rotated by 120°. The procedure is repeated until the desired mill depth is achieved.

Article Snippet: M. B. Stern and T. R. Jay, “Dry-Etching for Coherent Refractive Microlens Arrays,” J Opt a-Pure Appl Op 8, S407– S429 (1994).

Techniques:

Fig. 4. Focusing properties characterization of microlenses by mapping the intensity at different planes around the focus (a-c, a microlens with a sag height 7.3 µm) (d,e,f,g). Cross- sectional view through the focused beam for microlenses with 7.3 µm, 9 µm, 13.2 µm and 1.8 µm sag height, respectively. Some misalignments in the figures are due to the mechanical drift and vibrations. h) Comparison of intensity profiles at the focus of the microlenses with the corresponding Airy function fit.

Journal: Optics Express

Article Title: Fabrication of glass microlenses using focused Xe beam

doi: 10.1364/oe.26.013647

Figure Lengend Snippet: Fig. 4. Focusing properties characterization of microlenses by mapping the intensity at different planes around the focus (a-c, a microlens with a sag height 7.3 µm) (d,e,f,g). Cross- sectional view through the focused beam for microlenses with 7.3 µm, 9 µm, 13.2 µm and 1.8 µm sag height, respectively. Some misalignments in the figures are due to the mechanical drift and vibrations. h) Comparison of intensity profiles at the focus of the microlenses with the corresponding Airy function fit.

Article Snippet: M. B. Stern and T. R. Jay, “Dry-Etching for Coherent Refractive Microlens Arrays,” J Opt a-Pure Appl Op 8, S407– S429 (1994).

Techniques: Comparison